digital imaging and microscopes

The HRX-01 is the result of over 40 years of optical manufacturing from Hirox 

NIR confocal microscopy is ideally suited for use at various points within the failure analysis (FA) workflow because it is non-destructive and allows inspection of both Si bulk integrity and active level/layer areas.

Easily slides between the zoom body and viewing head, providing 75mm extension and 25mm height without compromising image quality or magnification. Compatible with Nikon and Unitron Stereo Microscopes with common main objective.