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Wafer loading and macro inspection systems for semiconductor wafer inspection.
3”, 100mm, 125 mm, 150mm, 200m. Set up two different sizes to save time when switching from one size to another.
Tek-Reps will work with you to customize for your specific needs
standard, thinned, TAIKO, transparent, MEMS and other special wafer substrates.
for cross-slot detection and mapping.
No ESD generation minimize down time due to end effector wear.
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