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Your Single Source Solution for Optical Inspection and Measurement
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Your Single Source Solution for Optical Inspection and Measurement
Wafer Loaders and Wafer Mapping Systems
Three Axis imaging and measurement systems configured for you. Build it your way with only the options you want
Infrared Microscopes and Confocal Systems create the ideal nondestructive, semiconductor subsurface imaging tool. SWIR microscopes and cameras offer affordable benchtop SWIR imaging
Microscopes, 4K digital cameras and NIR digital cameras add additional capabilities to your existing microscopes
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